Dielectric functions and electronic band structure of lead zirconate titanate thin films
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چکیده
منابع مشابه
Effects of thickness on the piezoelectric and dielectric properties of lead zirconate titanate thin films
Lead zirconate titanate ~PZT! thin films with a Zr/Ti ratio of 52/48 were deposited on platinized silicon substrates by a sol-gel method and crystallized with preferred ~111! or ~100! orientation. Both the piezoelectric properties (d33) and the field-induced strains of the films with different thickness and preferred orientation were measured by a laser Doppler heterodyne interferometer. The we...
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The photochemical growth of silver nanoparticles on the negative domains of lead zirconate titanate thin films is reported. A sample of highly [100] orientated lead zirconate titanate, with a ratio of 30:70, that was 65-70 nm thick grown on Pt-coated MgO was poled by use of piezoresponse force microscopy to produce defined regions of surface positive and negative polarization. A comparison betw...
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s of 2007 Conference on Implantable Auditory Prostheses, July 15–20,
متن کاملResidual stress effects on piezoelectric response of sol-gel derived lead zirconate titanate thin films
Piezoelectric properties of three sol-gel derived Pb Zr0.53Ti0.47 O3 thin film specimens of different thicknesses integrated onto Pt/Ti/SiO2 Si substrates are investigated to delineate the influence of residual stress on the strain-field response characteristics from other thickness related effects. Residual tensile stresses are determined from wafer curvature measurements for films ranging in ...
متن کاملIonic and electronic conductivity in lead–zirconate–titanate (PZT)
Accurate impedance measurements on differently sized samples of lead–zirconate–titanate (PbZr0.53Ti0.47O3, PZT) have been analyzed with a CNLS procedure, resulting in the separation of the ionic and electronic conductivities over a temperature range from f 150 to 630 jC. At 603 jC the electronic conductivity shows approximately a (PO2) 1/4 dependence, while the ionic conductivity remains consta...
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ژورنال
عنوان ژورنال: Journal of Applied Physics
سال: 2005
ISSN: 0021-8979,1089-7550
DOI: 10.1063/1.2128043